March 2022 FAQ: Testing Complex Microcircuits
Take a look at some of our most frequently asked questions:
What is Integra's experience in testing complex microcircuits?
- Integra has been testing complex microprocessors, microcontrollers, FPGAs, SerDes, Memorys and ASICs for 37+ years.
What is Integra's experience in memory devices?
- Integra has the capability to test the following Memory devices:
- NAND Flash up to 4 Terabit, working on a 8TB
- DD4: We have several active projects. We are testing 3600Mb but our testers can do higher
- NOR Flash - we have the capability to do the highest density available
- SRAM - we test under 10 nsec; 16M or higher density
- MRAMs
What is Integra's experience in testing FPGAs?
- Our dedicated FPDA test engineers have developed over 300 test programs for FPGAs from:
- AMD (Xilinx)
- Intel (Altera)
- Microchip (Microsemi)
- We have design software and testing methodologies in place for all FPGA families
- We have developed our own independent proprietary test methods
- We use in-house tools and any other development tools available from the manufacturer
- We create the test vectors and configuration vectors for our testers
- We do functional at-speed testing (using design modeling, not datasheet)
- We test to datasheet AC specs considering internal FPGA performance characteristics. Test plan implementation includes comprehensive DC parameters.
What capabilities does Integra have in terms of advanced automated testers?
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Our most advanced SmartScale testers have the following capabilities to test:
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DDR4 up to 2133Mbps and beyond / DDR4 up to 3600Mbps
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Future DDR5 to 3600Mbps
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High speed Serial Memories >1Gbps
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Mobile DDRx support to 3600Mbps
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HS LVDS Drive & receiver Buffers >1Gps
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Differential signals with precision eye placement
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32 lane/multi-port PCI Express switch solutions
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RF 12-bit ADC with 2.6 GSPS+ conversion rate
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RF 14-bit DAC with 2.5GSPS+ conversion rate
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ADCs with 10-bit accuracy at 105MSPS low offset and low power <120mW
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ADCs with 12-bit 2.6GSPS 1.3/2.5V A
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DACs with 14-bit 2.5GSPS RF DAC
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32-lane 8-port PCle Switch with 32Gbps switching capacity
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Precision Rail-to-Rail low Bbas(1pA) OP AMP with low offset voltage
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Quadruple capacity available when multi-site testing employed with handler or hand test (4-site in parallel)
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High speed SERDES to 8Gbps
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DS25BR100/101 3.125Gbps LVDS Buffer w/transmit pre-emphasis and receive equalization