Reliability Testing from CORWIL Technology

Posted by Susan Campbell on Wed, Jul 20, 2016 @ 08:00 AM

What's NEW...chroma-3650-ex

  • CORWIL can now perform ALL JESD22-A113 Precondition work IN-HOUSE, as well as
    before and after CSAM with the Sonoscan D9000.  
  • CORWIL has taken delivery of a NEW Chroma 3650 EX Tester, 1024 channels, 96 DPS


Focused Test FTI 1000 Test System

High Voltage Supply: 1,200V, 100mA (70VA max), (expandable to 3,600V)
High Power Supply: 100A pulsed, 4A continuous 55V compliance (expandable to 200A)
Low Leakage Measurements: <10nA
Digitizer – Dual Channel: 25 MS/s
TMU: 625ps resolution
Quad VI Boar: 40V, 100mA

Capable of performing package final test or wafer sort on:


Power discrete devices:

- GaN and SiC Power Transistors
- Bipolar Transistors
- Thyristors/SCR
- Diodes/Rectifiers

Intelligent Power Modules/DrMOS:

- Regulators (PWM, LDO, etc.)
- Motor/Solar Controllers
- Battery Chargers
- Drivers ( MOSFET, LED, etc.)
- Temperature Management

Analog IC devices

CORWIL-reliability-test We Want to Hear From You!


Call: 408.618.8700