Integra Technologies has teamed with Focused Test, Inc. to deliver a perfect solution for testing power discrete devices, power management IC's and Intelligent Power Modules
Integra Technologies has teamed with Focused Test, Inc. to deliver a perfect solution for testing power discrete devices, power management IC's and Intelligent Power Modules. In addition to standard silicon devices, FTI 1000 is capable of testing Wide Band Gap devices using GaN and SiC technologies. FTI 1000 is capable of performing a wide range of DC, thermal resistance and AC tests on power discrete devices.
The MOSFET AC parameters tested by the FTI 1000 include Inductive Load (UIL/UIS), Gate Charge (Qg, Qgs, Qgd), Gate Resistance (Rg), Gate Capacitance (Cg, Ciss, Coss, Crss) and high voltage Switching/Timing Tests. The FTI 1000 also offers analog test resources to enable Smart Power devices to be tested, such as Half Bridge power modules. FTI 1000 can also perform Dynamic Rdson testing on GaN HEMT wide band gap discrete devices.
The FTI 1000 performs IC and Multi-Chip Module testing using the IC Channel Board equipped with:
- Multiple Quad VI's
- TMU
- Pulse Generators
- Comparators
- Digital Instruments
- C Bits with Readback
Additional channel boards can be easily added, depending on the required configuration, and each channel board can be synchronized by a cabled 'Sync Bus'.