JULY 2025
Testing Complex Microcircuits
The importance of testing complex microcircuits in semiconductors lies in ensuring performance, reliability, and safety for high-stakes applications. These circuits power everything from aerospace systems to medical devices and advanced communications—so even the smallest defect can lead to system failure, data loss, or safety risks.
Explore some of our commonly asked questions:
Q: Why is testing complex microcircuits important?
- Functional Integrity - Validates that the microcircuit performs exactly as designed across all operating conditions and modes.
- Defect Detection - Identifies manufacturing defects (shorts, opens, leakage, timing issues) early—before packaging or deployment.
- Reliability Assurance - Confirms the device will operate consistently over time, under thermal, electrical, or environmental stress.
- Mission-Critical Safety -Essential for applications in defense, aerospace, automotive, and healthcare, where failure is not an option.
- Yield and Cost Efficiency -Reduces costly returns, rework, and field failures by screening out faulty devices early.
Q: What is Integra's experience in testing complex microcircuits?
- Integra has been testing complex microprocessors, microcontrollers, FPGAs, SerDes, Memorys and ASICs for 40+ years.
Q: What is Integra's experience in memory devices?
A: Integra has the capability to test the following Memory devices:
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- NAND Flash up to 8 Terabit
- DD4: We have several active projects. We are testing full datasheet speed
- NOR Flash - we have the capability to do the highest density available
- SRAM - we have the capability to do the highest density available
- MRAMs - we have the capability to do the highest density available
Q: What is Integra's experience in testing FPGAs?
A: Our dedicated FPGA test engineers have developed over 300 test programs for FPGAs from:
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- AMD (Xilinx)
- Intel (Altera)
- Microchip (Microsemi)
- We have design software and testing methodologies in place for all FPGA families
- We have developed our own independent proprietary test methods
- We use in-house tools and any other development tools available from the manufacturer
- We create the test vectors and configuration vectors for our testers
- We do functional at-speed testing (using design modeling, not datasheet)
- We test to datasheet AC specs considering internal FPGA performance characteristics. Test plan implementation includes comprehensive DC parameters.
Q: What capabilities does Integra have in terms of advanced automated testers?
A: Our most advanced SmartScale testers have the following capabilities to test:
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DDR4 up to 2133 Mbps and beyond
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DDR5 to 3600 Mbps
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High speed Serial Memories >1Gbps
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Mobile DDRx support to 3600Mbps
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HS LVDS Drive & receiver Buffers >1Gps
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Differential signals with precision eye placement
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32 lane/multi-port PCI Express switch solutions
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RF 12-bit ADC with 2.6 GSPS+ conversion rate
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RF 14-bit DAC with 2.5GSPS+ conversion rate
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ADCs with 10-bit accuracy at 105MSPS low offset and low power <120mW
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ADCs with 12-bit 2.6GSPS 1.3/2.5V A
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DACs with 14-bit 2.5GSPS RF DAC
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32-lane 8-port PCle Switch with 32Gbps switching capacity
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Precision Rail-to-Rail low Bbas(1pA) OP AMP with low offset voltage
- Quadruple capacity available when multi-site testing employed with handler or hand test
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High speed SERDES to 8Gbps
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DS25BR100/101 3.125Gbps LVDS Buffer w/transmit pre-emphasis and receive equalization
Have more questions? Let us know: sales_inquiry@integra-tech.com