Integra has been testing Flash devices since the early 1990’s with hundreds of different part types test programs developed to date and literally millions of devices tested.  More specifically on the NAND flash, the marketplace has exploded in the last couple of years in the Military & Space COTs sector with the advent of 128Gb+ densities and favorable Radiation test results. NAND has quickly become the preferred Non-Volatile memory choice of system designers and the user has myriad of options in speed, features, densities, SLC or MLC cell types, and various form-factors of packaging & configurations. However, the one important area of product options that is not available from OEMs today is the extended temperature range offering. This is where Integra excels by providing test services for parts at the extended (beyond commercial) and the Military temperature range of -55C to 125C.

NAND Flash Testing Features at Integra

NexTest Maverick series ATE

V93K Test Platform

NAND Flash testing


Tester Platform Verigy 93K

Baseline Test programs developed for all DDRx SDRAM types

Characterization of Critical Parameters

EverspinMRAM Testing at INTEGRA

Tester Platform Advantest T5382A

Delta-Flex UTS model 1220 tri-temperature handler

Full support for all EverspinMRAM devices

Contact Us

Integra Technologies - Wichita
Semiconductor Development & Test Services 

3450 N. Rock Road, Building #100
Wichita, KS USA 67226 

Sales: (800) 622-2382

Main#: (316) 630-6800
Fax: (316) 630-6877


Analytical Solutions - Albuquerque
DPA & FA Services

10401 Research Rd. SE,
Albuquerque NM, 87123

Sales - (800) 622-2382

Technical Support - (505) 299-1967
Fax: (505) 292-0225 


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