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Manufacturer |
Model |
Type |
Digital |
Analog |
Memory |
RF |
Other |
Agilent |
HP83000 F120t |
SoC Test System |
368ch, 120 MHz, Scan |
4PDPS X2, PMU (1) per pin, SWI (2), SVS, SCM(2) |
8MEG vector |
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Credence |
ASL 1000 |
Mixed Signal Test System |
28Mhz , DDD(1) |
OVI(2), PVI(1), ACS(1), DVI (3), DOAL(2), HVS(1) |
32K Vector |
TMU (1), Mux (2) |
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Credence |
ASL 1000 |
Mixed Signal Test System |
28Mhz, DDD(1) |
OVI(2), PVI(1), ACS(1), DVI (3), HVS(1) |
32K Vector |
TMU (1), Mux (2) |
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Credence |
ASL 1000 |
Mixed Signal Test System |
PV3(4), DVI(8), HVS(2) |
TMU (1), MuxHV (3) |
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Credence |
ASL 3000RF |
Mixed Signal/RF Test System |
32ch, 50Mhz MDI(2) |
DVI(3), OVI(4) |
16M vector |
Ports (16), RF Sources (3), Receivers (4), 2 Ch Baseband |
MUX (1), AWG (1), AVD (1) |
Credence |
STS-120 |
Digital IC Test System |
120, 20Mhz |
3 PMU |
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Credence |
Quartet |
Mixed Signal Test System |
376ch, 200Mhz, Scan |
DPS (10), HF AWG1A (slot 1), LF AWG (slot 2), LF ACP (slot 3), HF ACP (slot 4), DCP-Master (slot 5), DCP-Slave (slot 6), PMU (1) per 8 pins |
16M PPM |
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NexTest |
Maverick PT |
SoC IC Test System |
64ch, 66MHZ |
2M pattern |
2048 Kbits PE1, 2048 Kbits PE2, 2048 Kbits PE3, 2048 Kbits PE4, 36 Mbits APG, 36M ECR |
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Teradyne |
J750 |
Digital IC Test System |
512ch (64 x 8), 100Mhz data rate |
DPS (8), PMU(1) per pin (high voltage / current) |
16M / pin vector |
CTO (1), MTO (1), TimeSets (256 global), EdgeSets (32 / pin) |
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LTX |
DeltaSTE |
Digital IC Test System |
496ch, 62.5Mhz, |
DPS (4) |
CPM (16K), DPMY (4M) |
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LTX |
Micromaster Plus |
Digital IC Test System |
128ch, 50Mhz, Quads(2) |
DPS (4), VI (2) |
CPM (4K), DPMY (8M) |
TimingSets (32), Response (64), Formats (64) |
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LTX |
Micromaster II |
Digital IC Test System |
256ch, 40Mhz, Quads(4) |
DPS (4), VI (4) |
CPM (4K), APG (0-255), DPMY (8M) |
TimingSets (32), Response (64), Formats (64) |
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LTX |
TS80 DX90 |
Mixed Signal Test System |
24 Digital Channels, 12.5Mhz |
VI(5), VS(8), Audio Source, Audio Voltmeter |
Timer Front End Stretcher |
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LTX |
TS80 DX90 |
Mixed Signal Test System |
24 Digital Channels, 12.5MHz |
VI (6), VS(8), PVI (2), WS371 Waferorm Simulator, Audio Voltmeter, Nanoampmeter |
Timer Front End Stretcher |
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LTX |
TS88 DX90 |
Mixed Signal Test System |
24 Digital Channels, 12.5MHz |
VI (6), VS(8), PVI (2), Audio Source (2), Telecom Audio Voltmeter, Nanoampmeter |
TMP4 Timer Multiprocessor |
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MCT |
2020 |
Digital IC Test System |
32 Channels, 10 MHz |
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MCT |
2020 |
Digital IC Test System |
32 Channels, 10 MHz |
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Schlumberger (Fairchild) |
S-20 |
Digital IC Test System |
60ch HS, 120ch HS, 20MHz |
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Schlumberger (Fairchild ) |
S-20 |
Digital IC Test System |
60ch HS, 60 ch HV, 20Mhz |
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Schlumberger (Fairchild) |
Xincom 5588 |
Memory Test System |
40 Channels, 25 MHz |
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Schlumberger (Fairchild) |
Xincom 5588 |
Memory Test System |
40 Channels, 25 MHz |
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Teradyne |
J750 |
Digital IC Test System |
512ch (64 x 8), 100Mhz data rate |
DPS (8), PMU(1) per pin (high voltage / current) |
16M / pin vector |
CTO (1), MTO (1), TimeSets (256 global), EdgeSets (32 / pin) |
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Teradyne |
J937 |
Memory Test System |
36 Channels, 50 MHz |
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Teradyne |
J937 |
Memory Test System |
36 Channels, 50 MHz |
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Teradyne |
J937 |
Memory Test System |
36 Channels, 50 MHz |
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Teradyne |
J937 |
Memory Test System |
36 Channels, 50 MHz |
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Teradyne |
J937 |
Memory Test System |
36 Channels, 50 MHz |
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Teradyne |
J937 |
Memory Test System |
36 Channels, 50 MHz |
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Credence |
SC212 |
Digital IC Test System |
256 Channels, 50 MHz |
4DPS 2PMU 1 APE |
1.5M vector |
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Amkor |
RFT |
RF Test System |
Digital Data Port |
8 DC Supplies, 3 Arbitrary Func Gen, 4 Channel Digitizer, |
2 6GHz SigGen, 6GHz Spectrum Analyzer, 6GHz Network Analyzer, 6GHz Power Meter |
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Amkor |
RFT |
High Power DC test system |
Digital Data Port |
8 DC Supplies. 3 Arbitrary Func Gen, 40amp Supply, programmable load, 4 Channel Digitizer |
Manufacturer |
Model |
| Aetrium | 5050S, 5050T, 5050 |
| Aseco | S134 |
| EG Probers | (3" to 8") |
| MCT | 3608 |
| Multitest | 8704 |
| RVSI | LS3700 Scanners |
| Seiko | NS6040 (Parallel Test) |
| Symtek | 300 |
| Synax | 1211 (Dual Site) |
| Tesam | 8653D |
Integra Reliability Chambers Equipment
Chamber |
Type |
Conditions |
Speed |
Drivers |
Pattern |
AEHR Test |
Dynamic Burn-in |
125°C Stnadard 70°C - 150°C |
1Mhz |
8 Clk 16 / 32 In |
2K / 32K |
Loranger |
Discrete Burn-in |
70°C - 150°C |
DC |
Bias |
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Express Test |
HAST |
70°C - 131°C 85% - 100% RH 1-5 ATM |
DC |
Bias |
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Despach |
85 / 85 |
85% RH 85°C |
DC |
Bias |
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Blue M |
Stay Bake |
70°C - 150°C |
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Thermotron |
Temp Cycle |
-65°C - 150°C |
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SAS |
Steam Age |
Military Standard |
INTEGRA
TEST EQUIPMENT DATA SHEETS
| Description | File Type | File Size |
| Agilent HP83000 F120t Tester Data Sheet | 
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| Credence Quartet 1 Tester Data Sheet |
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| Teradyne J750 Tester Data Sheet |
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| Integra RFT Tester Data Sheet |
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