Integra Technologies ESD Latch up IC test

Avionics, Military and Semiconductor Test and Evaluation Solutions
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Semiconductor, IC Test Software Development

Integra's engineering group is available now for semiconductor test software development and test processing support. We manage the development, characterization and correlation of your test programs locally before taking advantage of the benefits of transferring your product to one of our contract test manufacturing facilities off-shore. This aids the customer by offering turnkey test software and hardware development services which help to decrease capital expenditure costs.

Test Software and Hardware Development & Engineering Support

  • RF, Logic, Linear, Mixed Signal, Analog, Digital, Memory and Strip Test - Supporting ALL package styles
  • Electrical Characterization Testing (Hot and Cold Temp)
  • Test Software Conversions
  • Hardware Development and Equipment Selection
  • Offshore Transfer to Amkor Factories

Test Platform Conversions

  • Transfer a device running on a test system to a newer test system:
    • Test system may now be obsolete
    • Moving a product line to offshore
    • Old platform is too slow, too old or just not capable enough

  • Services offered:
    • Pattern and program conversions
    • Correlation analysis
    • New hardware design and interface
    • Hardware conversion verification

  • Integra has converted hundreds of test programs from older, slower systems to newer and more capable test equipment

Extensive High Speed Digital & Mixed Signal Engineering Expertise

  • Development Experience with Complex Devices:
    • Microprocessors / DSP / Microcontroller / Graphic Engines
    • Communications (Ethernet, DSL, Base Band, Networking)
    • Consumer (Games, Digital Audio, Digital TV, Set Top Box)
    • System-On-a-Chip (SOC) / High Performance ASIC and ASSP

  • Digital Test Development Capabilities:
    • Simulation to Test Vector Conversion
    • >600 pins @ >600Mhz, ± 125ps
    • Algorithmic Memory Test
    • Pattern Depth 28Meg & SCAN (>128M)
    • Emphasis on Multi-site

  • Mixed Signal Capabilities:
    • Audio to 20 bits, Video to 60 MHz
    • TIF to 600 MHz, RF to 6 GHz
    • Time & Jitter Digitizer

General Purpose Mixed Signal Test Expertise

  • Experience will all Linear types:
    • DAC & ADC
    • Switches & Multiplexers
    • Discrete & Arrays
    • OpAmps & Comparitors
    • Interface

  • Custom On Board Circuitry:
    • Low Leakage
    • Feedback loops
    • High Accuracy

  • Semi-Manufacturer Development
  • Emphasis on Strip Testing
  • Product Engineering and Qualification

Memory Test Expertise

  • Extensive Pattern Library:
    • Quiet Pattern Testing
    • 74xxx, 16/32-bit, ECL

  • High Speed/Accuracy Testing:
    • Golden Device Routines
    • Bench Calibration Techniques

  • Semi-Manufacturer Involvement
  • Product Engineering and Qualification

Verification Test & Detection of Counterfeit ICs and Semiconductors

RF Test

  • Established Reputation for RF IC testing

  • Test Development Centers:
    • 6 GHz capability
    • Experienced engineering staff
    • Complete Test Integration Engineering
      • Provide contactor interface
      • Handler integration
      • Internal RF Hardware / Board design
    • Qualification and Characterization Services

  • World-Wide Production Processing & Support

Other Development Services Available

For more information on our Test Software Development services, please contact an Integra Sales Office or fill out a Request for Additional Information.

Description File Type File Size
  Integra Technologies Software Library Listing
35 kb
  Integra Technologies Test Software Development Data Sheet
176 kb

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