| Integra Adds Verigy 93k P1000 and 12” Probe Capability
WICHITA, KS – June 10, 2009 – Integra Technologies, LLC., leading supplier of test services in the US, announced that it has added a Verigy 93K P1000 tester for package and probe test of high speed, high pin count, mixed signal devices and high speed multi-site memory test. The tester has 800 digital pins with 1000Mbits/sec data rates and greater than 600Mhz frequency capabilities. Digital pattern depths of 56Meg including memory test Algorithmic Pattern Generator capabilities. Analog resources include PMU per pin, 16 power supplies and 16/24bit Digitizers and 16/18bit Waveform Generators. Integra has also added a TSK UF3000 12" Wafer Prober. The addition of this prober to Integra’s existing equipment set, gives them capability to probe 3” to 12” wafers. About Integra Integra Technologies has been providing semiconductor testing, qualification, and related technical services to manufacturers and users of semiconductor devices for over 25 years. Integra offers these services from its two locations in Wichita, Kansas, and Santa Clara, California and has earned an outstanding reputation for quality, consistent performance, technical expertise and on-time delivery. Integra specializes in software development, hardware design and development, electrical test, qualification testing, ESD and latch up testing. Integra has one of the largest and most experienced test engineering organizations in the industry with electrical test expertise encompassing both final test and probe, including bumped wafer probe and supports the entire spectrum of device technologies including RF, digital, linear, analog and mixed signal and memory technologies. Kent Wade For more information on our Test Services, please contact an Integra Sales Office or fill out a Request for Additional Information. |
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